This search combines search strings from the content search (i.e. "Full Text", "Author", "Title", "Abstract", or "Keywords") with "Article Type" and "Publication Date Range" using the AND operator.
Beilstein J. Nanotechnol. 2018, 9, 1728–1734, doi:10.3762/bjnano.9.164
Figure 1: Outline of the AFIR process. Si(100) wafers with a native layer of SiO2 were coated with Fe2O3. Ant...
Figure 2: (a) SEM image of the antidot array patterned on the film with 27 nm thickness. (b) Profile obtained...
Figure 3: XRD patterns of the as-deposited Fe2O3 film (blue curve) and the Fe3O4 film (red curve) after the t...
Figure 4: Central region of the hysteresis curves for the antidot arrays obtained from a 27 nm thick film. (a...
Figure 5: (a) Coercivity of the initial thin film and of the square (blue squares) and the hexagonal (red tri...
Figure 6: Coercivity (red squares) and normalized remanence (blue dots) as a function of the angle θ at which...